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Keywords Diffraction Loss Diffraction Parameter Double Edged Hilltop Electricity Elevation Profile Fresnel Zone Information security Inventory Process Occultation Distance Path Inclination Pathloss Pathloss Model Photovoltaic Radius of Curvature Radius of Fresnel Zone Rounded Edge Obstruction Single Edged Hilltop Steganalysis Steganography Workflow learning
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ISSN: 2367-7449