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Keywords Diffraction Loss Diffraction Parameter Double Edged Hilltop Electricity Elevation Profile Fresnel Zone Information security Inventory Process Microwave Link Model Tuning Occultation Distance PVSyst Path Inclination Pathloss Pathloss Model Photovoltaic Radius of Curvature Rounded Edge Obstruction Single Edged Hilltop Workflow steganography
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ISSN: 2367-7449